《微電子可靠性》致力于傳播有關(guān)微電子器件、電路和系統(tǒng)可靠性的最新研究成果和相關(guān)信息，從材料、工藝和制造，到設(shè)計(jì)、測(cè)試和操作。雜志的內(nèi)容包括:測(cè)量、理解和分析;評(píng)估和預(yù)測(cè);建模與仿真;方法和緩解。將可靠性與微電子工程的其他重要領(lǐng)域，如設(shè)計(jì)、制造、集成、測(cè)試和現(xiàn)場(chǎng)操作相結(jié)合的論文也將受到歡迎，并特別鼓勵(lì)在該領(lǐng)域和具體應(yīng)用領(lǐng)域報(bào)告實(shí)際案例研究的論文。大多數(shù)被接受的論文將作為研究論文發(fā)表，描述重大進(jìn)展和完成的工作。審查一般感興趣的重要發(fā)展主題的論文可以作為審查論文發(fā)表。可以考慮將性質(zhì)較初步的緊急來(lái)文和關(guān)于目前感興趣的已完成實(shí)際工作的簡(jiǎn)短報(bào)告作為研究說(shuō)明出版。所有的貢獻(xiàn)都要經(jīng)過(guò)該領(lǐng)域主要專(zhuān)家的同行審查。其他常規(guī)功能包括:?專(zhuān)門(mén)討論重大國(guó)際會(huì)議或重要發(fā)展主題的專(zhuān)題?給編輯的信?行業(yè)新聞和更新?即將舉行活動(dòng)的日歷?書(shū)評(píng)微電子可靠性是一個(gè)不可或缺的論壇，在學(xué)術(shù)和工業(yè)環(huán)境的微電子可靠性專(zhuān)業(yè)人士之間，以及所有那些以任何方式與一個(gè)穩(wěn)步增長(zhǎng)的微電子工業(yè)及其許多應(yīng)用領(lǐng)域相關(guān)的人之間，交流知識(shí)和經(jīng)驗(yàn)。

icroelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.Additional regular features will include:? Special issues devoted to significant international conferences, or to important developing topics? Letters to the Editors? Industrial news and updates? Calendar of forthcoming events? Book reviewsMicroelectronics Reliability is an indispensable forum for the exchange of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way with a steadily growing microelectronics industry and its many fields of application.